JPH043109B2 - - Google Patents
Info
- Publication number
- JPH043109B2 JPH043109B2 JP60134571A JP13457185A JPH043109B2 JP H043109 B2 JPH043109 B2 JP H043109B2 JP 60134571 A JP60134571 A JP 60134571A JP 13457185 A JP13457185 A JP 13457185A JP H043109 B2 JPH043109 B2 JP H043109B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- wafer ring
- ring
- storage
- storage portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13457185A JPS61292336A (ja) | 1985-06-20 | 1985-06-20 | ウエハ−保持装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13457185A JPS61292336A (ja) | 1985-06-20 | 1985-06-20 | ウエハ−保持装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61292336A JPS61292336A (ja) | 1986-12-23 |
JPH043109B2 true JPH043109B2 (en]) | 1992-01-22 |
Family
ID=15131453
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13457185A Granted JPS61292336A (ja) | 1985-06-20 | 1985-06-20 | ウエハ−保持装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61292336A (en]) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108872260A (zh) * | 2017-05-11 | 2018-11-23 | 无锡华润安盛科技有限公司 | 晶圆检测治具及晶圆检测装置 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5169453A (en) * | 1989-03-20 | 1992-12-08 | Toyoko Kagaku Co., Ltd. | Wafer supporting jig and a decompressed gas phase growth method using such a jig |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3976288A (en) * | 1975-11-24 | 1976-08-24 | Ibm Corporation | Semiconductor wafer dicing fixture |
JPS569976Y2 (en]) * | 1976-12-13 | 1981-03-05 | ||
JPS5956742U (ja) * | 1982-10-06 | 1984-04-13 | ソニー株式会社 | 半導体素子取扱いリング |
-
1985
- 1985-06-20 JP JP13457185A patent/JPS61292336A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108872260A (zh) * | 2017-05-11 | 2018-11-23 | 无锡华润安盛科技有限公司 | 晶圆检测治具及晶圆检测装置 |
CN108872260B (zh) * | 2017-05-11 | 2021-12-24 | 无锡华润安盛科技有限公司 | 晶圆检测治具及晶圆检测装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS61292336A (ja) | 1986-12-23 |
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